The JEOL JSM IT500 scanning electron microscope (SEM) is used for high-resolution imaging and qualitative X-ray microanalysis of conductive and non-conductive samples at a magnification range between ...

two scanning probe microscopes and three transmission electron microscopes. The electron microscopes in the main suite are all fitted with digital image capture and energy dispersive X-ray systems for ...

The JEOL 1400 High Contrast Transmission Electron Microscope is a state-of-the-art imaging system designed for high-resolution transmission electron microscopy (TEM). This microscope features advanced ...

2 scanning electron microscopes (SEM), 2 transmission electron microscopes (TEM), 2 laser scanning confocal microscopes,1 deconvolution light microscope, 1 wide-field multimode light microscope, and 1 ...

SEM stands for scanning electron microscope. The SEM is a microscope that uses electrons instead of light to form an image. Since their development in the early 1950's, scanning electron microscopes ...

grant by NSF in Summer 2014 to purchase a new electron microprobe, a JEOL JXA-8230 equipped with LaB6 electron gun (PIs K.H. Mahan, J.M. Allaz, and G.L. Farmer). This new instrument will replace the ...