The JEOL JSM IT500 scanning electron microscope (SEM) is used for high-resolution imaging and qualitative X-ray microanalysis of conductive and non-conductive samples at a magnification range between ...

I used to have access to some pretty nice Scanning Electron Microscopes (a SEM) at my day job. While they are a bit more complex than a 3D printer, they are awfully handy when you need them.

two scanning probe microscopes and three transmission electron microscopes. The electron microscopes in the main suite are all fitted with digital image capture and energy dispersive X-ray systems for ...

The JEOL 1400 High Contrast Transmission Electron Microscope is a state-of-the-art imaging system designed for high-resolution transmission electron microscopy (TEM). This microscope features advanced ...

SEM stands for scanning electron microscope. The SEM is a microscope that uses electrons instead of light to form an image. Since their development in the early 1950's, scanning electron microscopes ...

The JSM-700F is equipped with a large specimen chamber that accommodates a wide variety of detectors simultaneously, including: Secondary and back scattered electron imaging detectors, EDS for ...

Scanning electron microscopy is a general type of electron microscopy that generates a topological image of a sample using a beam of electrons to achieve much higher spatial resolution than light ...

grant by NSF in Summer 2014 to purchase a new electron microprobe, a JEOL JXA-8230 equipped with LaB6 electron gun (PIs K.H. Mahan, J.M. Allaz, and G.L. Farmer). This new instrument will replace the ...

2 scanning electron microscopes (SEM), 2 transmission electron microscopes (TEM), 2 laser scanning confocal microscopes,1 deconvolution light microscope, 1 wide-field multimode light microscope, and 1 ...